M.Sc. (Semester II) (CBCS) Examination Mar/Apr-2018
Physics (Materials Science)
ANALYTICAL TECHNIQUES
Time: 2½ Hours
Max. Marks: 70
Instructions: Q.1 and Q.2 are compulsory. Attempt any 3 questions from Q. 3 to 7 All questions carry equal marks.
Q.1

Select Correct alternatives:
06
For hexagonal crystal system
90
60
120
80
For rhombohedral crystal system γ
≠120
=90
=120
≠90
The has a 2-fold axis of rotoinversion.
Hexagonal
Cubic
Orthorhombic
Rhombohedral
Addition of bravais lattice and basis is called
Grain
Molecule
Atom
Crystal
FT-IR uses a laser as an internal wavelength standard.
He-Ne
YAG
He-Hg
Ne-Hg
In XPS the K.E of electron is dependent on
of sample
of spectrometer
Vacuum level of sample
Vacuum level of spectrometer

Fill in gaps.
04
For monoclinic crystal system
For fcc system the number of atoms per unit are
In XPS, photoelectrons are produced using
The indices are coefficient of a vector perpendicular to that plane.

State True False.
04
Number of atoms per unit primitive cell depends on the types of crystal system.
In case of tetragonal crystal system a≠b≠c.
In XPS, Spin orbital splitting and peak area ratios assist in element identifications.
Number of atoms per unit bcc system are 4.
Q.2
Explain Attenuated Total Reflection
05
Determine reciprocal lattice vectors for SC crystal structure.
05
Give the applications of Raman spectroscopy.
04
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SLR-UN-477
Q.3
What do you mean by lattice? How many different crystals systems are possible in nature i.e. the lattice could be extended in three dimensions.
10
Show basic unit cell, define vectors or a2, a3) and angles
04
Q.4
Explain in details basic principle, working and applications of the Raman Spectroscopy.
10
Explain the difference between stokes and antistokes scattering.
04
Q.5
Explain in details the lattice parameters and crystal structure in tetragonal system.
10
Write a note on Beer Lamberts Law.
04
Q.6
Draw and explain instrumentation set of FTIR spectroscopy.
10
Draw energy levels in Infra red absorption.
04
Q.7
How we can calculate chemical shift, quantification, and depth-profiling using XPS?
10
How particle size has been calculated using X-ray diffractograms.
04