M.Sc. Physics (Material Science) (Semester IV) (CBCS)
Examination, 2017
ADVANCED TECHNIQUES OF MATERIALS CHARACTERIZATION
Day Date: Saturday, 29-04-2017 Max. Marks: 70
Time: 02.30 PM to 05.00 PM
Instructions and are compulsory.
Answer any three questions from Q.3 to Q.7.
All questions carry equal marks.
Q.1 Objective questions. 14
Choose the correct alternative:
The resonance frequency range for electron in case of ESR is close
to …….
10 GHz 100 MHz 100 GHz 100 Hz
Charge on X-ray is ……..
a)+1.6x10-19C -1.6x10-19C Neutral 9.1x10-31C
In scanning electron microscope …..are impinged on the sample
surface to get the surface information.
Electrons Photons X-rays Phonon
The energy of the back scattered electrons in SEM is ……that of
secondary electrons.
Equal
to
Greater than Less than None of these
In TEM ……is usually used as cathode material, which is acts as a
source of electron.
Tungsten Aluminum Copper Nickel
The XPS, …... Impinged onto the surface of material and …. are
ejected out.
High energy radiation, electrons
High energy ions, X-ray
IR radiation, ion
Electron, phonon
The energy of the back scattered electrons in SEM is …… that of
secondary electrons
t
Equal to Greater than Less than None of these
Page 1 of 2
Wavelength of the electrons in transmission electron
microscope is ……
4000-7000 Å
1-100 mm
few A
electron being particle does not possesses any wavelength.
State True or False:
in NMR Zeeman effect leads to hyperfine structure.
backscattered electrons are as a result of inelastic scattering of
electron with nucleus of specimen atom.
AFM image looks brown in colour because the sample emits
brown coloured radiations.
While recording the SEM image of an insulating sample, sample
surface gets charges which need to be grounded.
While analyzing SAED pattern energy of the scattered energy is
mapped and analyzed.
In order to increase the resolution of a microscope, one should
increase magnification.
Q.2 Write short note on: 14
Optical microscope
Electron energy analyzer
Raman spectra of carbon based materials.
Q.3 What do you mean by surface? What are different probes used for
surface characterization. What is order of vacuum required to
record the XPS spectra and why? 08
Explain what are bright field and dark field images in TEM. How do
they are formed? 06
Q.4 Explain the process of image formation in scanning Tunneling
Microscopy (STM). Also explain different parts and their working in
detail. 10
Explain what is selected area electron diffraction (SAED) also
elucidate its use in materials characterization. 04
Q.5 Draw schematic of TEM and explain working of each part 10
What are secondary and backscattered electrons? What is their
origin? Where those are useful. 04
Q.6 Explain basic working principle of X-ray photoelectron microscopy
with the help of suitable example 08
With the help of suitable example qualitative and quantitive
analysis of Auger electron spectrum. 06
Q.7 What is EPR condition? Explain in detail continuous wave EPR and
EPR line width 08
Explain the necessity of high resolution NMR spectrometer for solid
samples, if any