M.Sc. (Nano-Technology) (Semester II)
(CBCS) Examination, 2017
CHARACTERIZATION TOOLS OF NANOMATERIALS
Day Date: Wednesday, 19-04-2017 Max. Marks: 70
Time: 10.30 AM to 01.00 PM
N. B. Part-I, question 1 is compulsory.
Attempt any four questions from Part II
Figures to the right indicate full marks.
Answers to the Part I and Part II are to be
written in same answer booklet only.
Part-I
Q.1 Rewrite the sentence after choosing correct answer from the
given alternatives:
07
A scanning tunneling microscope is an instrument for
imaging surfaces at the
Atomic level Chemical level
Magnetic level Physical level
Transmission electron microscopy is microscopy
technique in which a beam of electrons is transmitted through
an specimen, interacting with the specimen as it passes
through it.
Ultra-thin Single-thin
Strong material Thick material
XRD is used to find the structure of an unknown material.
Crystalline Amorphous
Gas phase Solid phase
Raman spectroscopy is a spectroscopic technique used to
observe rotational, and other low-frequency modes in a
system.
Stunning Tunneling
Wagging Vibrational
Young's modulus, also known as the elastic modulus, is a
measure of the of a solid material.
Hardness Smoothness
Stiffness Rigidness
Page 1 of 2
SLR-RU 812
The Poisson's ratio in which a material tends to expand in
directions to the direction of compression.
Rectangular Perpendicular
Triangular Vertical
HRTEM is an imaging of the TEM that allows for of the
atomic structure of the sample.
Indirect image Direct image
Blur image None image
Q.1 Definition: 07
SEM
EDAX
UV-Vis Spectroscope
XPS
SIMS
Young's modulus
HRTEM
Part-II
Answer any four of the following
Q.2 With a neat diagram explain SEM and give its important applications. 14
Q.3 What is meant by TEM and explain in detail TEM. 14
Q.4 What is meant by Raman spectroscopy and give a brief explanation on
Raman spectroscopy.
14
Q.5 Give a brief account on NMR. 14
Q.6 Write a short note about any two 14
a. DLS
b. DPI
c. EELS
Q.7 Explain in detail about any two 14
a. Poisson ratio
b. Bulge test
c. Non-linear Kerr effect