M.Sc. (Semester II) (CBCS) Examination Nov/Dec-2018
Nano-Technology
CHARACTERIZATION TOOLS OF NANOMATERIALS
Time: 2½ Hours Max. Marks: 70
Instructions: Part-I, question 1 is compulsory.
Attempt any four questions from Part II
Figures to the right indicate full marks.
Answers to the Part I and Part II are to be written in same answer
Booklet only.
PART I
Q.1 Rewrite the sentence after choosing correct answer from the given
alternatives:
07
The highest point resolution realized in phase contrast TEM is
around
500 ångströms 5 ångströms
50 ångströms 0.5 ångströms
Samples for SEM have to be prepared to withstand the
and high energy beam of electrons.
vacuum conditions air conditions
moisture conditions pressure conditions
An optical spectrometer is an instrument used to measure
over a specific portion of the electromagnetic spectrum.
Properties of moisture Properties of current
Properties of charge Properties of light
The UV-visible spectrophotometer can also be configured to
measure
reflectance refractance
diffraction none of these
NMR is a research technique that exploits the of certain
atomic nuclei.
magnetic properties chemical properties
physical properties all of these
Surface tension is a force per unit length acting in the plane of the
between the liquid.
interface reflectance
reflaction diffraction
Sample reactions can be assayed in well format microtiter
plates.
65-1800 6-1536
600-2500 60-2000
Page 2 of 2
SLR-VT-529
Q.1 Define the following terms. 07
STM
EDAX
XPS
DPI
Spectroscopy
Youngs modulus
Quantum Yield
PART II
Answer any four of the following:
Q.2 Describe with the help of a neat diagram scanning electron microscope
(SEM).
14
Q.3 Give an brief explanation on transmission electron microscopy (TEM). 14
Q.4 With a neat diagram explain working principle and applications of XRD. 14
Q.5 Describe with the help of neat diagram Fourier-transform infrared
spectroscopy (FTIR).
14
Q.6 Answer any Two of the following: 14
Surface tension
TGA
Thermal conductivity
Q.7 Attempt any two of the following:- 14
Quantum yield
HRTEM
Excitation wavelength